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Equipment Catalog

In-situ electrical characterization

Facility: Materials Synthesis and CharacterizationCategory: Electrical Probing Full Catalog

The Helios Nanolab 600 has two electrical feedthroughs (4 and 7 electrodes) for in situ electrical characterization including electron beam induced imaging (EBIC) capabilities. In addition, the system allows to bias independently the micromanipulated probe (Omniprobe) and the stage, allowing multiple sample biasing configurations.

Manufacturer: Helios NanoLab

Equipment Catalog

In-situ electrical characterization

Contact

Fernando Camino

Location

Lab Phone

Brookhaven National Laboratory

Brookhaven Science Associates