General Lab Information

Equipment Catalog

In-situ electrical characterization

Facility: Materials Synthesis and CharacterizationCategory: Electrical Probing Full Catalog

The Helios Nanolab 600 has two electrical feedthroughs  (4 and 7 electrodes) for in situ electrical characterization including electron beam induced imaging (EBIC) capabilities. In addition, the system allows to bias independently the micromanipulated probe (Omniprobe) and the stage, allowing multiple sample biasing configurations.

Manufacturer: Helios NanoLab