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Equipment Catalog

Universal X-ray Diffractometer

Facility Materials Synthesis and CharacterizationCategory X-Ray and Light Scattering Full Catalog

Rigaku Ultima III is a universal diffractometer capable of characterizing thin films, bulk powders, and surfaces. Supported techniques include small angle scattering, in-plane diffraction, X-ray reflectivity,  powder diffraction, and reciprical space mapping. The Rigaku Ultima III is equipped with cross beam optics for point or parallel beam geometries. The instrument can be setup with monochrmator for measurements of fluorescent materials (e.g Fe, Co).

Manufacturer: Rigaku Ultima III