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Ambient Pressure XPS & UPS with in vacuo IRRAS

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The lab-based AP-PES instrument allows for surface chemical analysis via core-level (XPS) and valance-level (UPS) photoelectron spectroscopy at gas pressures up to ~ 10 Torr and sample temperatures up to 500 °C.  Applications include in-operando studies of surface chemistry, catalysis, and energy storage processes.  This instrument is located at the CFN and has 4 photon sources: monochromated Al (1486.6 eV), Mg (1253.6 eV), Cr (5417 eV), and He (20.2, 40.8 eV). Differential pumping allows for gas pressures in the Torr range at the sample while maintaining ultrahigh vacuum conditions in the analyzer.  Suitable sample types include single crystals, foils, and powders.  Samples can be moved through the vacuum system to an infrared reflection absorption spectroscopy (IRRAS) chamber with a polarizer, where IR data can be collected under gas pressures ranging from UHV to ~20 Torr. Samples can be heated to 500 °C and cool to -180 °C. A sample preparation chamber connects the PES and IR chambers. Ar sputtering, cooling to -180 °C, heating to 900 °C, low gas dosing, and metal evaporation are available in the preparation chamber.

Manufacturer: Specs Analyzer & Bruker IR