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FEI Titan 80-300
A dedicated Environmental Transmission Electron Microscope (E-TEM)
Contact: Dmitri Zakharov (primary)
This instrument is the first 80-300kV field-emission environmental transmission electron microscope to be installed in the US with an objective-lens aberration corrector. It has a spatial resolution of 0.08nm in the high-resolution phase contrast mode, and is capable of achieving this resolution at unusually high pressures due to the differential pumping apertures and custom pumping arrangement that is incorporated with the system. The maximum gas pressure for the environmental-cell is about 20mbar for N2, with other maximum pressures dependent on the atomic weight of the gas. As a result, this instrument is uniquely well-suited to imaging the fundamental mechanisms of catalysis and catalyzed nanostructure growth. The instrument has also scanning transmission imaging (STEM), magnetic imaging, and chemical analysis capabilities. It has a Lorentz lens and a bi-prism for imaging electrostatic and magnetic potentials or fields in materials. It is also equipped with an energy dispersive x-ray spectrometer and an electron energy-loss image filter spectrometer. A mass-flow controlled catalytic reaction system capable of providing controlled pressures of gas mixtures allows careful control over catalyzed reactions, as well as holders for provision of liquids, atmospheric pressure gases and controlled temperature excursions through MEMS-based heating elements. The system is fitted with a Gatan K2-IS — a first of it’s kind ‘direct electron detector’ dedicated to high frame rate / low dose imaging of reactions.
Specifications
300 kV | 300 kV E-TEM | 80 kV | 80 kV E-TEM | |
---|---|---|---|---|
TEM Information Limit | 80 pm | < 120 pm | 150 pm | < 200 pm |
TEM Point Resolution | 80 pm | < 140 pm | 150 pm | < 200 pm |
Energy Resolution (EELS) | 0.8 eV | 0.8 eV | 0.8 eV | 0.8 eV |
STEM Resolution | 140 pm | 200 pm | <300 pm | < 300 pm |
Probe Current (1 nm) | 0.6 nA | 0.6 nA | 0.6 nA | 0.6 nA |
Spherical Abberation | < 1 um | < 1 um | < 1 um | < 1 um |
Sample Holders
Holder | Alpha | Beta | Notes |
---|---|---|---|
Double tilt, low x-ray background | ±40 deg | ±30 deg | Be sample cup |
Single tilt tomography | ±70 deg | N/A | |
Single tilt heating (800 C max) | ±40 deg | N/A | |
Double tilt heating (800 C max) | ±30 deg | ±15 deg | E-TEM compatible |
Nanofactory STM single tilt | ±30 deg | N/A | In-situ electrical probing, I/V curves, scanning probe imaging |
Protochips Aduro double tilt heating | ±30 deg | ±15 deg | E-TEM compatible, 1000 C max, 1000 deg/ms heating rate |
DENS Solutions Tomography/Heating Holder |
±70 deg |
N/A |
ETEM Compatible, 900C Max, 1000 deg/ms heating rate |
Hummingbird Scientific Liquid Cell - Electrochemistry Holder |
±30 deg |
N/A |
Capable of atmospheric pressure liquid provision |