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Low Energy Electron Microscope V (LEEM)

Facility Proximal ProbesCategory Scanning and Probing Microscopy Full Catalog

A field-emission low-energy electron microscope (Elmitec LEEM V) allows for in-situ microscopic studies of dynamic surface processes. It is capable of operating at variable temperatures (200 K to over 1500 K) and at pressures from UHV to about 10-5 torr, with micro-diffraction capability.  The spatial resolution in LEEM imaging is better than 6 nm.

Manufacturer: Elmitec LEEM V