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Ambient Scanning Probe Microscope

Facility Proximal ProbesCategory Scanning and Probing Microscopy Full Catalog

Park NX-20 atomic force microscope for surface imaging at ambient conditions at room temperature, as well as at elevated temperatures. It provides capabilities for standard contact and non-contact AFM operation, as well as Lateral Force Microscopy (LFM), Scanning Capacitance Microscopy (SCM), Magnetic Force Microscopy (MFM), Scanning Tunneling Microscopy (STM) and Nanolitography, among others.

Manufacturer: Park NX20