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Equipment Catalog
Park NX-20 Atomic Force Microscope
Proximal ProbesCategory: Scanning and Probing Microscopy Full Catalog
Park NX-20 atomic force microscope for surface imaging at ambient conditions at room temperature, as well as at elevated temperatures. It provides capabilities for standard contact and non-contact AFM operations, as well as Lateral Force Microscopy (LFM), Scanning Capacitance Microscopy (SCM), Scanning Electrochemical Cell Microscopy (SECCM), Scanning Ion Conductance Microscopy (SICM), Magnetic Force Microscopy (MFM), Scanning Tunneling Microscope (STM), and Nanolithography.
Manufacturer: Park NX20
