General Lab Information

Equipment Catalog

Park NX-20 Atomic Force Microscope

Facility: Proximal ProbesCategory: Scanning and Probing Microscopy Full Catalog

Park NX-20 atomic force microscope for surface imaging at ambient conditions at room temperature, as well as at elevated temperatures. It provides capabilities for standard contact and non-contact AFM operations, as well as Lateral Force Microscopy (LFM), Scanning Capacitance Microscopy (SCM), Magnetic Force Microscopy (MFM), Scanning Tunneling Microscope (STM) and Nanolithography.

Manufacturer: Park NX20