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Equipment Catalog
Park NX-20 Atomic Force Microscope
Proximal ProbesCategory: Scanning and Probing Microscopy Full Catalog
Park NX-20 atomic force microscope for surface imaging at ambient conditions at room temperature, as well as at elevated temperatures. It provides capabilities for standard contact and non-contact AFM operation, as well as Lateral Force Microscopy (LFM), Scanning Capacitance Microscopy (SCM), Magnetic Force Microscopy (MFM), Scanning Tunneling Microscopy (STM) and Nanolithography, among others.
Manufacturer: Park NX20