General Lab Information

Equipment Catalog

Electron Beam Induced Current (EBIC) Imaging-Helios G5

Facility: NanofabricationCategory: Electron Microscopy Full Catalog

EBIC is an analysis technique in the SEM, which creates images using the electrical response of the sample as a function of the scanning position of the electron beam. Among several applications, EBIC can be used to image p-n junctions in solar cells and also to view defects in semiconductor diodes.

Manufacturer: Thermofisher Helios G5 UX