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Equipment Catalog
Zeiss Ultra 810 5.4Kev X-ray Microscope
Materials Synthesis and CharacterizationCategory: X-Ray and Light Scattering Full Catalog
The Zeiss Xradia Ultra 810 enables non-destructive imaging of materials at the nanoscale using absorption contrast using 5.4 keV x-rays. From 2D radiographs to 3D tomographic reconstructions the tool can reveal internal microstructure and watch it evolve in real time under load. The tool operates with two modes, a large field of view mode with 65um FOV and 150nm resolution, and a high-resolution mode with a 16um FOV and 50nm resolution.
Manufacturer: Zeiss Xradia 810 Ultra XRM 5.4Kev
Location: 1L17
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Aaron Michelson
(631) 344-4349, amichelson@bnl.gov
Lab Phone: Not available