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Equipment Catalog
Zeiss Crossbeam 350 (3D Volume Tomography and Tomography Prep)
Materials Synthesis and CharacterizationCategory: Electron Microscopy Full Catalog
The ZEISS Crossbeam FIB/SEM combines high-resolution SEM-EDS imaging with precise FIB milling for advanced nanoscale characterization and sample preparation. The SEM operates from approximately 0.02–30 kV, while the gallium ion beam typically ranges from 0.5–30 kV with beam currents up to 100 nA. The system features volume tomography (3nm slice) with EDS, a STEM detector for transmission imaging, and a quick-exchange load lock for rapid sample transfer and improved throughput.
Manufacturer: Zeiss Crossbeam 350
Location: 1L32
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Aaron Michelson
(631) 344-4349, amichelson@bnl.gov
Lab Phone: (631) 344-8225
