General Lab Information

JEOL JEM-1400 Transmission Electron Microscope

» Electron Microscopy Facility

Contact: Kim Kisslinger

New software included with the JEM 1400 TEM provides a complete set of tutorials and user guides to help the beginning microscopist familiarize themselves with the instrument, but also allow the more experienced user to explore and utilize more advanced features.

  TEM Mode STEM Mode
Resolution
Lattice Image 0.20 nm -
Point Image 0.38 nm -
Accelerating Voltage
Steps (5) 40 - 120 kV  
Variable Steps 30 V min, step  
Magnification
Mag Mode x200 - x1,200,00 x5000 - x2,000,000
Low Mag Mode x50 - x1000 x120 - x4000
SA Mag Mode x2000 - x300,000 -
Specimen Chamber
Specimen Tilt Angle (x-axis) +/-25 deg +/-25 deg
  (+/-70 deg w/optional holder) (+/-70 deg w/optional holder)

JEM-1400 TEM Features

  • Easily changeable accelerating voltages from 40-120 KeV.
  • Scanning image observation device allows bright field STEM imaging with 2nm edge-to-edge resolution.
  • 2048x2048 Gatan CCD camera for further ease of use and quick throughput.
  • Single tilt LN cryotransfer holder allows frozen sections or suspensions to be loaded into TEM frost free.

Application Areas