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Fernando Camino

Staff Scientist | Electron Microscopy


  • Electrical Characterization
  • Electronic Noise Measurements
  • Hall Effect Measurements
  • In-Situ Electrical Characterization in an SEM
  • Electron Beam Induced Current Imaging
  • UV, E-beam and Ion-beam Lithography
  • Electronic Device Fabrication
  • EDS and WDS analysis in SEM

CFN Research Activities

“I am experienced in electrical characterization of nanostructured materials subjected to light, temperature and magnetic fields stimuli. These studies usually demand the development of novel nanofabrication techniques. For example, I am currently working in the use of an aberration-corrected STEM to perform e-beam lithography, pushing the limits of conventional lithography processes towards the fabrication of devices with 1 nm features.”


  • B.S.: National Engineering University, Lima, Peru
    • Major: Physics
  • PhD: Stony Brook University (Physics)
    • Graduate Program in Physics and Astronomy
    • Dissertation Title: Investigations of Electronic Noise in Selected Mesoscopic Devices

Professional Appointments

  • Postdoctoral Research: Stony Brook University (Physics)
    • Department of Physics and Astronomy
    • Project: Fabrication and study of quantum interferometers in the integer and fractional quantum Hall regimes

Selected Publications & Research Highlights

V. R. Manfrinato, F. E. Camino, A. Stein, L. Zhang, M. Lu, E. A. Stach, and C. T. Black, “Patterning Si at the 1 nm Length Scale with Aberration-Corrected Electron-Beam Lithography: Tuning of Plasmonic Properties by Design,” Advanced Functional Materials,  201903429, doi:10.1002/adfm.201903429 (2019).

Y. Li, J. Wu, F. Camino, G. D. Gu, I. Bo┼żovic, and  J. M. Tranquada, “Large surface conductance and superconductivity in topological insulator microstructures,” Applied Physics Letters 115, 173507 (2019).

F. E. Camino, V.R. Manfrinato, A. Stein, L. Zhang, M. Lu, E. A. Stach, and C. T.  Black, “Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope,” J. Vis. Exp. (139), e58272, doi:10.3791/58272 (2018).