Jim Ciston

Jim Ciston is a newly appointed Research Associate in the Electron Microscopy group at the Center for Functional Nanomaterials, having recently completed his PhD in Materials Science with Prof. Laurence Marks at Northwestern University in 2009. He is an expert in the field of electron diffraction and was the first to refine hydrogen positions and localized 3D charge density perturbations at crystal surfaces. His current research interests include in-situ studies of the structural mechanisms responsible for the efficacy of catalytic materials under reactive gas environments, with a focus on oxide surfaces and metal/oxide interfaces. He is also interested in correlating structural and charge defects responsible for novel electronic properties in engineered oxide materials with atomically sharp interfaces and how these defects are perturbed by the environment and adsorbates. Jim's main instrument at CFN is the Cs-corrected FEI Titan Environmental Transmission Electron Microscope.

Last Modified: October 10, 2008
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