Esther Tsai

Esther’s research aims to develop optimized processing and analysis pipelines for synchrotron X-ray data, including that of coherent diffractive imaging and scattering experiments, to extract embedded information and increase throughput. Signal processing techniques and reconstruction algorithms can be utilized for example to enhance spatial or spectral resolution, reveal chemical relevance, as well as suggest efficient experimental procedures. Esther does user support for small-angle and wide-angle X-ray scattering (SAXS/WAXS) at 11-BM (CMS) and 12-ID (SMI) at NSLS-II.

• B.S.: Purdue University
  • Major: Electrical Engineering; Minor: Economics
• PhD: Purdue University
  • Electrical Engineering
  • Dissertation Title: Optimization-Based Optical and Terahertz Imaging

• Postdoctoral Research: Paul Scherrer Institute
  • Swiss Light Source
  • Project: X-ray ptychographic tomography

ORCID: https://orcid.org/0000-0002-5885-6317

• K. Wakonig, H.-C. Stadler, M. Odstrcil, E. H. R. Tsai, A. Diaz, M. Holler, I. Usov, J. Raabe, A. Menzel and M. Guizar-Sicairos, PtychoShelves, a versatile high-level framework for high-performance analysis of ptychographic data, Journal of Applied Crystallography 53, 574-586 (2020). [DOI: 10.1107/S1600576720001776]
  • Publisher's version: http://scripts.iucr.org/cgi-bin/paper?S1600576720001776
  • Free publicly available manuscript (OSTI): https://www.osti.gov/biblio/1607716-ptychoshelves-versatile-high-level-framework-high-performance-analysis-ptychographic-data

• A. M. Levine, G. Bu, S. Biswas, E. H. R. Tsai, A. B. Braunschweig and B. L. Nannenga, Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering, Chemical Communications 56, 4204-4207 (2020). [DOI: 10.1039/D0CC00119H]
  • Publisher's version: https://pubs.rsc.org/en/content/articlelanding/2020/CC/D0CC00119H#!divAbstract
  • Free publicly available manuscript (OSTI): https://www.osti.gov/biblio/1607705-crystal-structure-orientation-organic-semiconductor-thin-films-microcrystal-electron-diffraction-grazing-incidence-wide-angle-ray-scattering

• Z. Guan, E. H. R. Tsai, X. Huang, K. G. Yager, H. Qin, PtychoNet: Fast and High-Quality Phase Retrieval for Ptychography, British Machine Vision Conference (2019).

• E. H. R. Tsai, F. Marone, M. Guizar-Sicairos, Gridrec-MS: an algorithm for multi-slice tomography, Optics Letters 44, 2181-2184 (2019). [DOI: 10.1364/OL.44.002181]
  • Publisher's version: https://www.osapublishing.org/ol/abstract.cfm?uri=ol-44-9-2181

• E. H. R. Tsai, J. Billaud, D. F. Sanchez, J. Ihli, M. Odstrcil, M. Holler, D. Grolimund, C. Villevieille, and M. Guizar-Sicairos, Correlated X-ray 3D ptychography and diffraction microscopy visualize links between morphology and crystal structure of lithium-rich cathode materials, iScience 11, 356–365 (2019). [DOI: 10.1016/j.isci.2018.12.028]
  • Publisher's version: https://www.sciencedirect.com/science/article/pii/S258900421830258X?via%3Dihub
  • Free publicly available manuscript (OSTI): https://www.osti.gov/biblio/1547905-correlated-ray-ptychography-diffraction-microscopy-visualize-links-between-morphology-crystal-structure-lithium-rich-cathode-materials

• S. DeAngelis, P. Stanley Jørgensen, E. H. R. Tsai, M. Holler, K. Kreka, J. R. Bowen, Three- dimensional characterization of nickel coarsening in solid oxide cells via ex-situ ptychographic nano-tomography, Journal of Power Sources 383, 72-79 (2018). [DOI: 10.1016/j.jpowsour.2018.02.031]

• M. Holler, M. Guizar-Sicairos, E. H. R. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, High-resolution non-destructive three-dimensional imaging of integrated circuits, Nature 543, 402–406 (2017). [DOI: 10.1038/nature21698] 

• S. H. Shahmoradian, E. H. R. Tsai, A. Diaz, M. Guizar-Sicairos, J .Raabe, L. Spycher, M. Britschgi, A. Ruf, H. Stahlberg and M. Holler, Three-dimensional imaging of biological tissue by cryo x-ray ptychography, Scientific Reports 7, 1-12 (2017). [DOI: 10.1038/s41598-017-05587-4]

• E. H. R. Tsai, A. Diaz, A. Menzel, and M. Guizar-Sicairos, X-ray ptychography using a distant analyzer, Optics Express 24, 6441–6450 (2016).  [DOI: 10.1364/OE.24.006441] 

• E. H. R. Tsai, I. Usov, A. Diaz, A. Menzel, and M. Guizar-Sicairos, X-ray ptychography with extended depth of field, Optics Express 24, 29089–29108 (2016). [DOI: 10.1364/OE.24.029089 ]